Advancements in AI and IoT for Chip Manufacturing and Defect Prevention / Rupal Jain.
Advancements in AI and IoT for Chip Manufacturing and Defect Prevention / Rupal Jain.
Advancements in AI and IoT for Chip Manufacturing and Defect Prevention / Rupal Jain.
About this item
Full title
Author / Creator
Publisher
Gistrup, Denmark : River Publishers, [2024]
Alternative title
Record Identifier
MMS ID
Language
English
Formats
Physical Description
Physical content
1 online resource (152 pages)
Content type
text
Media type
computer
Carrier type
online resource
Publication information
Publisher
Gistrup, Denmark : River Publishers, [2024]
Edition
First edition.
Date Published
[2024]
Subjects
More information
Scope and Contents
Summary
This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.
Alternative Titles
Full title
Advancements in AI and IoT for Chip Manufacturing and Defect Prevention / Rupal Jain.
Variant title
BOOK
Authors, Artists and Contributors
Author / Creator
Notes
General note
River Publishers Rapids Series on Intelligence in Chips Series
Includes bibliographical references and index.
Issued As
9788770046817
8770046816
Contextual Information
Date Copyright
©2024
Identifiers
Primary Identifiers
Record Identifier
74VKLqo0OvNb
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/74VKLqo0OvNb
Other Identifiers
ISBN
8770046808
9781040259870
1040259871
9788770046831
8770046832
9788770046824
8770046824
9788770046800
DDC
004.678
MMS ID
991024647967902626
