Log in to save to my catalogue

IEEE International Symposium on Electromagnetic Compatibility : [record].

IEEE International Symposium on Electromagnetic Compati...

IEEE International Symposium on Electromagnetic Compatibility : [record].

https://devfeature-collection.sl.nsw.gov.au/record/74VvwrRXX4K3

IEEE International Symposium on Electromagnetic Compatibility : [record].

About this item

Full title

IEEE International Symposium on Electromagnetic Compatibility : [record].

Publisher

[New York, N.Y. : Institute of Electrical and Electronics Engineers] c1977-c1983.

Alternative title

Institute of Electrical and Electronic Engineers International Symposium on Electromagnetic Compatibility.

Call Numbers

TQ041319

Record Identifier

74VvwrRXX4K3

MMS ID

991004328089702626

Language

English

Formats

Physical Description

Physical content

7 v. : ill. ; 28 cm.

Frequency

Annual.

Contents

Compensating for Shielded Enclosure Effects on Radiated Emission Measurements / Robert B. Smith -- Transfer Impedance Measurement of a 19"-Subrack / J. Bernauer and A. Schwab -- Non-Traditional Methods of Screening in Electromagnetic Systems / S. M. Apollonskii -- Testing of Microwave Shielding Gask...

K. P. Ma, J. L. Drewniak, T. H. Hubing and T. P. Van Doren -- A New and Simple Method for the Direct Measurement of Microwave Power Radiated From Gasketed Seams / J. P. Quine, D. Overrocker, K. Fisher, J. P. Streeter and A. J. Pesta -- Development of an Embedded Terminal Protection Device (TPD) Test...

Dawn H. Trout and George C. Marshall -- Simulated and Experimental Effects of ESD on CMOS Timing Circuits / Ahmad Mahinfallah and Robert Nelson -- Computational Aspects of a Nonlinear Problem Involving Electromagnetic Transients in Ferromagnetic Shields / William J. Croisant, Carl A. Feickert and Mi...

Finite Element Analysis of Dispersion Characteristics of Microstrip Lines Lying Near Substrate and Ground Plane Edges / Bruce R. Crain and Andrew F. Peterson -- Analysis on the Effectiveness of Clock Trace Termination Methods and Trace Lengths on a Printed Circuit Board / Mark Montrose -- Susceptibi...

M. Schwerdt, J. Berger and K. Peterman -- The Electromagnetic Radiation of Small Circuits and Small Loop Antennas / W. Scott Bennett -- Selection of the Variable Edmax in Calibration of Log Periodic Antennas / Clifford Kraft and Benjamin Banner -- Magnetic Shielding Principles of Linear Cylindrical...

Koji Takei, Osamu Ishii and Masakatsu Senda -- To Reinforce Immunities Around GHz Frequencies by EMI Noise Suppression Filters / Shinji Wakamatsu, Frank Tilley, Gerry Hubers, Yukio Sakamoto, Toshimi Kaneko, Hidetoshi Yamamoto and Yoshihiro Kurokawa -- Routes to EMC Compliance: A Manufacturer Has Cho...

Publication information

Publisher

[New York, N.Y. : Institute of Electrical and Electronics Engineers] c1977-c1983.

Frequency

Annual.

Place of Publication

New York (State)

Date Published

c1977-c1983.

More information

Alternative Titles

Full title

IEEE International Symposium on Electromagnetic Compatibility : [record].

Abbreviated title

IEEE Int. Symp. Electromagn. Compat.

Notes

General note

Includes bibliographical references and index.

TQ041319 transferred from NQ621.305/31

Citation / References Note

Index to IEEE publications 0099-1368.

Chemical abstracts 0009-2258 1977-1978.

Computer & control abstracts 0036-8113.

Electrical & electronics abstracts 0036-8105.

Engineering index annual (1968) 0360-8557.

Engineering index bioengineering abstracts 0736-6213.

Engineering index energy abstracts 0093-8408.

Engineering index monthly (1984) 0742-1974.

Physics abstracts. Science abstracts. Series A 0036-8091....

Issued by note

Sponsored by the IEEE Electromagnetic Compatibility Group, 1977, by the IEEE Electromagnetic Compatibility Society, 1978-1982.

Contextual Information

Date Copyright

c1977-c1983.

Identifiers

Primary Identifiers

Call Numbers

TQ041319

Record Identifier

74VvwrRXX4K3

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/74VvwrRXX4K3

Other Identifiers

ISBN

0780372646

9780780332089

0780332083

9780780332072 (pbk.) :

0780332075 (pbk.) :

9780780356771 (softbound)

0780356772 (softbound)

9780780356788 (casebound)

0780356780 (casebound)

9780780356795 (microfiche)

0780356799 (microfiche)

9780780372641

ISSN

0190-1494

DDC

621.38043

MMS ID

991004328089702626

How to access this item

1 of 0Request as a Library member