On the conduction mechanisms of Au/(Cu2O–CuO–PVA)/n-Si (MPS) Schottky barrier diodes (SBDs) using cu...
On the conduction mechanisms of Au/(Cu2O–CuO–PVA)/n-Si (MPS) Schottky barrier diodes (SBDs) using current–voltage–temperature (I–V–T) characteristics
About this item
Full title
Author / Creator
Publisher
New York: Springer US
Journal title
Language
English
Formats
Publication information
Publisher
New York: Springer US
Subjects
More information
Scope and Contents
Contents
The temperature effect on the conduction mechanism of Au/Cu
2
O–CuO–PVA/n-Si (MPS) type Schottky barrier diodes (SBDs) have been investigated in detail in the wide temperature range of 100–380 K by using the forward bias current–voltage (I–V) measurements. It is observed that the semi logarithmic forward bias I–V plots have two distinct linea...
Alternative Titles
Full title
On the conduction mechanisms of Au/(Cu2O–CuO–PVA)/n-Si (MPS) Schottky barrier diodes (SBDs) using current–voltage–temperature (I–V–T) characteristics
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_crossref_citationtrail_10_1007_s10854_017_7900_8
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_crossref_citationtrail_10_1007_s10854_017_7900_8
Other Identifiers
ISSN
0957-4522
E-ISSN
1573-482X
DOI
10.1007/s10854-017-7900-8