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Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Micro...

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Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Micro...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_crossref_primary_10_1017_S1431927617004706

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

About this item

Full title

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

Author / Creator

Nishitani, Tomohiro , Narita, Akihiro , Tomita, Takeshi , Kitamura, Shin-ichi , Meguro, Takashi , Iijima, Hokuto , Fuchi, Shingo , Tabuchi, Masao , Honda, Yoshio and Amano, Hiroshi

Publisher

New York, USA: Cambridge University Press

Journal title

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.808-809

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Publication information

Publisher

New York, USA: Cambridge University Press

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Alternative Titles

Full title

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

Authors, Artists and Contributors

Author / Creator

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Primary Identifiers

Record Identifier

TN_cdi_crossref_primary_10_1017_S1431927617004706

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_crossref_primary_10_1017_S1431927617004706

Other Identifiers

ISSN

1431-9276

E-ISSN

1435-8115

DOI

10.1017/S1431927617004706

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