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Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_093f29ff548e4e1ea6c626a5b9376af2

Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

About this item

Full title

Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

Publisher

Basel: MDPI AG

Journal title

Computation, 2025-01, Vol.13 (1), p.15

Language

English

Formats

Publication information

Publisher

Basel: MDPI AG

More information

Scope and Contents

Contents

This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean...

Alternative Titles

Full title

Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_093f29ff548e4e1ea6c626a5b9376af2

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_093f29ff548e4e1ea6c626a5b9376af2

Other Identifiers

ISSN

2079-3197

E-ISSN

2079-3197

DOI

10.3390/computation13010015

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