A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measur...
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
About this item
Full title
Author / Creator
Publisher
Frankfurt am Main: Beilstein-Institut zur Föerderung der Chemischen Wissenschaften
Journal title
Language
English
Formats
Publication information
Publisher
Frankfurt am Main: Beilstein-Institut zur Föerderung der Chemischen Wissenschaften
Subjects
More information
Scope and Contents
Contents
Measuring resistances at the nanoscale has attracted recent attention for developing microelectronic components, memory devices, molecular electronics, and two-dimensional materials. Despite the decisive contribution of scanning probe microscopy in imaging resistance and current variations, measurements have remained restricted to qualitative compa...
Alternative Titles
Full title
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
Authors, Artists and Contributors
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_168cb1da49dc4742a0fa42695a09fafb
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_168cb1da49dc4742a0fa42695a09fafb
Other Identifiers
ISSN
2190-4286
E-ISSN
2190-4286
DOI
10.3762/bjnano.14.94
