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High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films

High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_1c46da205bc846ee93898c6fc40760f7

High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films

About this item

Full title

High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films

Publisher

Cairo, Egypt: Hindawi Publishing Corporation

Journal title

Advances in materials science and engineering, 2018-01, Vol.2018 (2018), p.1-6

Language

English

Formats

Publication information

Publisher

Cairo, Egypt: Hindawi Publishing Corporation

More information

Scope and Contents

Contents

Sb70Se30/SiO2 multilayer thin films were applied to improve the thermal stability by RF magnetron sputtering on SiO2/Si (100) substrates. The characteristics of Sb70Se30/SiO2 multilayer thin films were investigated in terms of crystallization temperature, ten years of data retention, and energy bandgap. It is observed that the crystallization tempe...

Alternative Titles

Full title

High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_1c46da205bc846ee93898c6fc40760f7

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_1c46da205bc846ee93898c6fc40760f7

Other Identifiers

ISSN

1687-8434

E-ISSN

1687-8442

DOI

10.1155/2018/9693015

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