A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of M...
A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning
About this item
Full title
Author / Creator
Publisher
Switzerland: MDPI AG
Journal title
Language
English
Formats
Publication information
Publisher
Switzerland: MDPI AG
Subjects
More information
Scope and Contents
Contents
Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry out two things, i.e., proof of design and manufact...
Alternative Titles
Full title
A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_201c8be828a14ff9a91d8b9384c07be0
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_201c8be828a14ff9a91d8b9384c07be0
Other Identifiers
ISSN
1424-8220
E-ISSN
1424-8220
DOI
10.3390/s23020705