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A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of M...

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of M...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_201c8be828a14ff9a91d8b9384c07be0

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

About this item

Full title

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Publisher

Switzerland: MDPI AG

Journal title

Sensors (Basel, Switzerland), 2023-01, Vol.23 (2), p.705

Language

English

Formats

Publication information

Publisher

Switzerland: MDPI AG

More information

Scope and Contents

Contents

Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry out two things, i.e., proof of design and manufact...

Alternative Titles

Full title

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_201c8be828a14ff9a91d8b9384c07be0

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_201c8be828a14ff9a91d8b9384c07be0

Other Identifiers

ISSN

1424-8220

E-ISSN

1424-8220

DOI

10.3390/s23020705

How to access this item