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Investigation of Influencing Factors on the Measurement Signal of a CMOS Image Sensor for Measuring...

Investigation of Influencing Factors on the Measurement Signal of a CMOS Image Sensor for Measuring...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_2945c29a3153423e8fd862027b2adccf

Investigation of Influencing Factors on the Measurement Signal of a CMOS Image Sensor for Measuring Field Emission Currents

About this item

Full title

Investigation of Influencing Factors on the Measurement Signal of a CMOS Image Sensor for Measuring Field Emission Currents

Publisher

Switzerland: MDPI AG

Journal title

Sensors (Basel, Switzerland), 2025-02, Vol.25 (5), p.1529

Language

English

Formats

Publication information

Publisher

Switzerland: MDPI AG

More information

Scope and Contents

Contents

We use optical CMOS image sensors for spatially and time-resolved measurement of the emission currents of field emission cathodes. The measured signal depends, on the one hand, on the emission current that flows from the cathode surface through the vacuum to the sensor surface. On the other hand, it is influenced by other variables, such as the ext...

Alternative Titles

Full title

Investigation of Influencing Factors on the Measurement Signal of a CMOS Image Sensor for Measuring Field Emission Currents

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_2945c29a3153423e8fd862027b2adccf

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_2945c29a3153423e8fd862027b2adccf

Other Identifiers

ISSN

1424-8220

E-ISSN

1424-8220

DOI

10.3390/s25051529

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