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Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling...

Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_2af0ca24a85c428e8c37393a138ed111

Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling microscopy

About this item

Full title

Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling microscopy

Publisher

Germany: Beilstein-Institut zur Föerderung der Chemischen Wissenschaften

Journal title

Beilstein journal of nanotechnology, 2022-02, Vol.13 (1), p.172-181

Language

English

Formats

Publication information

Publisher

Germany: Beilstein-Institut zur Föerderung der Chemischen Wissenschaften

More information

Scope and Contents

Contents

Thermal oxidation of Si(113) in a monolayer regime was investigated using high-temperature scanning tunneling microscopy (STM). Dynamic processes during thermal oxidation were examined in three oxidation modes – oxidation, etching, and transition modes – in the third of which both oxidation and etching occur. A precise temperature–pressure growth m...

Alternative Titles

Full title

Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling microscopy

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_2af0ca24a85c428e8c37393a138ed111

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_2af0ca24a85c428e8c37393a138ed111

Other Identifiers

ISSN

2190-4286

E-ISSN

2190-4286

DOI

10.3762/bjnano.13.12

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