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Latent tracks of swift Bi ions in Si3N4

Latent tracks of swift Bi ions in Si3N4

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_42dfd50ed3ee470bb8bcd9759db456e7

Latent tracks of swift Bi ions in Si3N4

About this item

Full title

Latent tracks of swift Bi ions in Si3N4

Publisher

Bristol: IOP Publishing

Journal title

Materials research express, 2020-02, Vol.7 (2), p.025512

Language

English

Formats

Publication information

Publisher

Bristol: IOP Publishing

More information

Scope and Contents

Contents

Parameters such as track diameter and microstruture of latent tracks in polycrystalline Si3N4 induced by 710 MeV Bi ions were studied using TEM and XRD techniques, and MD simulation. Experimental results are considered in terms of the framework of a 'core-shell' inelastic thermal spike (i-TS) model. The average track radius determined by means of e...

Alternative Titles

Full title

Latent tracks of swift Bi ions in Si3N4

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_42dfd50ed3ee470bb8bcd9759db456e7

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_42dfd50ed3ee470bb8bcd9759db456e7

Other Identifiers

E-ISSN

2053-1591

DOI

10.1088/2053-1591/ab72d3

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