Latent tracks of swift Bi ions in Si3N4
Latent tracks of swift Bi ions in Si3N4
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Bristol: IOP Publishing
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Language
English
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Bristol: IOP Publishing
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Contents
Parameters such as track diameter and microstruture of latent tracks in polycrystalline Si3N4 induced by 710 MeV Bi ions were studied using TEM and XRD techniques, and MD simulation. Experimental results are considered in terms of the framework of a 'core-shell' inelastic thermal spike (i-TS) model. The average track radius determined by means of e...
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Full title
Latent tracks of swift Bi ions in Si3N4
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TN_cdi_doaj_primary_oai_doaj_org_article_42dfd50ed3ee470bb8bcd9759db456e7
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_42dfd50ed3ee470bb8bcd9759db456e7
Other Identifiers
E-ISSN
2053-1591
DOI
10.1088/2053-1591/ab72d3