Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational inv...
Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational investigation
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5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography
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English
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5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography
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Resonant inelastic X‐ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high‐resolution (few hundred meV or less) RIXS measurements, especially in the soft X‐ray range, require low‐throughput grating spectrometers, which limits measurement accuracy. Here, the performance of a different method for measuring RIXS...
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Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational investigation
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TN_cdi_doaj_primary_oai_doaj_org_article_75d8cb1f78eb47a388bde8aeff9c3a45
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_75d8cb1f78eb47a388bde8aeff9c3a45
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ISSN
1600-5775,0909-0495
E-ISSN
1600-5775
DOI
10.1107/S1600577521011917
