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Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carri...

Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carri...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_763dd210632d425e936ddcb1a042cc24

Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3

About this item

Full title

Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3

Publisher

London: Nature Publishing Group UK

Journal title

Scientific reports, 2021-09, Vol.11 (1), p.18129-18129, Article 18129

Language

English

Formats

Publication information

Publisher

London: Nature Publishing Group UK

More information

Scope and Contents

Contents

Gallium nitride (GaN) is one of the most technologically important semiconductors and a fundamental component in many optoelectronic and power devices. Low-resistivity GaN wafers are in demand and actively being developed to improve the performance of vertical GaN power devices necessary for high-voltage and high-frequency applications. For the dev...

Alternative Titles

Full title

Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_763dd210632d425e936ddcb1a042cc24

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_763dd210632d425e936ddcb1a042cc24

Other Identifiers

ISSN

2045-2322

E-ISSN

2045-2322

DOI

10.1038/s41598-021-97253-z

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