Detection of small delamination in mullite/Si/SiC model EBC system by pulse thermography
Detection of small delamination in mullite/Si/SiC model EBC system by pulse thermography
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Beijing: Tsinghua University Press
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English
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Beijing: Tsinghua University Press
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The pulse thermography (PT) technique was applied to the detection of the delamination of a multi-layered coating system composed of mullite/Si onto a reaction-bonded SiC substrate. The potential evaluation was carried out in order to detect internal delamination in multi-layered material system. Moreover, the observation of the cross sections and...
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Detection of small delamination in mullite/Si/SiC model EBC system by pulse thermography
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TN_cdi_doaj_primary_oai_doaj_org_article_8864b259a5a1485a898a3fa61f79098e
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_8864b259a5a1485a898a3fa61f79098e
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ISSN
2226-4108
E-ISSN
2227-8508
DOI
10.1007/s40145-019-0327-3