Throughput and resolution with a next-generation direct electron detector
Throughput and resolution with a next-generation direct electron detector
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Publisher
England: International Union of Crystallography
Journal title
Language
English
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Publisher
England: International Union of Crystallography
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Contents
Direct electron detectors (DEDs) have revolutionized cryo-electron microscopy (cryo-EM) by facilitating the correction of beam-induced motion and radiation damage, and also by providing high-resolution image capture. A new-generation DED, the DE64, has been developed by Direct Electron that has good performance in both integrating and counting mode...
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Full title
Throughput and resolution with a next-generation direct electron detector
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TN_cdi_doaj_primary_oai_doaj_org_article_8e265c461b05457895a7dd596788351f
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_8e265c461b05457895a7dd596788351f
Other Identifiers
ISSN
2052-2525
E-ISSN
2052-2525
DOI
10.1107/S2052252519012661
