Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution
Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution
About this item
Full title
Author / Creator
Orlandi, G. L. , David, C. , Ferrari, E. , Guzenko, V. A. , Ischebeck, R. , Prat, E. , Hermann, B. , Ferianis, M. , Penco, G. , Veronese, M. , Cefarin, N. , Dal Zilio, S. and Lazzarino, M.
Publisher
College Park: American Physical Society
Journal title
Language
English
Formats
Publication information
Publisher
College Park: American Physical Society
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Scope and Contents
Contents
Results on fabrication and experimental characterization of wire scanners (WS) with submicrometer spatial resolution are presented. Independently fabricated at PSI and FERMI by means of nanolithography, the proposed WS solutions consist of 900 and 800 nm wide free-standing stripes ensuring a geometric resolution of about 250 nm. The nanofabricated...
Alternative Titles
Full title
Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution
Authors, Artists and Contributors
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_9277dcb5ccf6492398a0c5bd04426bea
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_9277dcb5ccf6492398a0c5bd04426bea
Other Identifiers
ISSN
2469-9888
E-ISSN
2469-9888
DOI
10.1103/PhysRevAccelBeams.23.042802
