Atomic resolution electron microscopy in a magnetic field free environment
Atomic resolution electron microscopy in a magnetic field free environment
About this item
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Author / Creator
Shibata, N. , Kohno, Y. , Nakamura, A. , Morishita, S. , Seki, T. , Kumamoto, A. , Sawada, H. , Matsumoto, T. , Findlay, S. D. and Ikuhara, Y.
Publisher
London: Nature Publishing Group UK
Journal title
Language
English
Formats
Publication information
Publisher
London: Nature Publishing Group UK
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Scope and Contents
Contents
Atomic-resolution electron microscopes utilize high-power magnetic lenses to produce magnified images of the atomic details of matter. Doing so involves placing samples inside the magnetic objective lens, where magnetic fields of up to a few tesla are always exerted. This can largely alter, or even destroy, the magnetic and physical structures of i...
Alternative Titles
Full title
Atomic resolution electron microscopy in a magnetic field free environment
Authors, Artists and Contributors
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Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_93ddd7a9cc58420097f10420d2afc6e8
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_93ddd7a9cc58420097f10420d2afc6e8
Other Identifiers
ISSN
2041-1723
E-ISSN
2041-1723
DOI
10.1038/s41467-019-10281-2
