Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer
Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer
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Basel: MDPI AG
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English
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Basel: MDPI AG
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Electrostatic force microscopy (EFM) is a useful technique when measuring the surface electric potential of a substrate regardless of its topography. Here, we have developed a frequency detection method for alternating current (AC) bias in EFM. Instead of an internal lock-in amplifier (LIA) for EFM that only detects ωe and 2ωe, we have used other L...
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Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer
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TN_cdi_doaj_primary_oai_doaj_org_article_962f22d69f1940fb8dce584f0319b818
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_962f22d69f1940fb8dce584f0319b818
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ISSN
2076-3417
E-ISSN
2076-3417
DOI
10.3390/app7070704
