Editorial for the Special Issue on Advanced Machine Learning Techniques for Sensing and Imaging Appl...
Editorial for the Special Issue on Advanced Machine Learning Techniques for Sensing and Imaging Applications
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Publisher
Basel: MDPI AG
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Language
English
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Basel: MDPI AG
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Contents
By exploiting the underlying image or signal models via a data-driven approach, these advanced machine learning techniques benefit applications from image reconstruction to analysis. Instead of only super-resolving images for visual quality, the proposed deep reconstruction scheme is coupled with a trainable analytical network, to enable reliable a...
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Full title
Editorial for the Special Issue on Advanced Machine Learning Techniques for Sensing and Imaging Applications
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TN_cdi_doaj_primary_oai_doaj_org_article_bcc47bdfa75e48deaafbdbebff51e5f3
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_bcc47bdfa75e48deaafbdbebff51e5f3
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ISSN
2072-666X
E-ISSN
2072-666X
DOI
10.3390/mi13071030
