Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy
Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy
About this item
Full title
Author / Creator
Lin, Rui , Qian, Jianqiang , Li, Yingzi , Cheng, Peng , Wang, Cheng , Li, Lei , Gao, Xiaodong and Sun, Wendong
Publisher
Switzerland: MDPI AG
Journal title
Language
English
Formats
Publication information
Publisher
Switzerland: MDPI AG
Subjects
More information
Scope and Contents
Contents
Quartz tuning forks (QTFs) are self-sensing and possess a high quality factor, allowing them to be used as probes for atomic force microscopes (AFMs) for which they offer nano-scale resolution of sample images. Since recent work has revealed that utilizing higher-order modes of QTFs can offer better resolution of AFM images and more information on...
Alternative Titles
Full title
Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy
Authors, Artists and Contributors
Author / Creator
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Primary Identifiers
Record Identifier
TN_cdi_doaj_primary_oai_doaj_org_article_be6df8b65d9b4a27b2c35e4993c6993d
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_be6df8b65d9b4a27b2c35e4993c6993d
Other Identifiers
ISSN
1424-8220
E-ISSN
1424-8220
DOI
10.3390/s23083923
