On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a...
On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
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London: Nature Publishing Group UK
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English
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London: Nature Publishing Group UK
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The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A qua...
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On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
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TN_cdi_doaj_primary_oai_doaj_org_article_c67b7326c0a14b8c8c1f0c65db0fcbf2
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_c67b7326c0a14b8c8c1f0c65db0fcbf2
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ISSN
2045-2322
E-ISSN
2045-2322
DOI
10.1038/s41598-023-37334-3
