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Crystal orientation of epitaxial film deposited on silicon surface

Crystal orientation of epitaxial film deposited on silicon surface

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_d5bb869b82c549d4b6525780f9d63bfa

Crystal orientation of epitaxial film deposited on silicon surface

About this item

Full title

Crystal orientation of epitaxial film deposited on silicon surface

Publisher

London: Nature Publishing Group UK

Journal title

Scientific reports, 2024-05, Vol.14 (1), p.10891-10891, Article 10891

Language

English

Formats

Publication information

Publisher

London: Nature Publishing Group UK

More information

Scope and Contents

Contents

Direct growth of oxide film on silicon is usually prevented by extensive diffusion or chemical reaction between silicon (Si) and oxide materials. Thermodynamic stability of binary oxides is comprehensively investigated on Si substrates and shows possibility of chemical reaction of oxide materials on Si surface. However, the thermodynamic stability...

Alternative Titles

Full title

Crystal orientation of epitaxial film deposited on silicon surface

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_doaj_primary_oai_doaj_org_article_d5bb869b82c549d4b6525780f9d63bfa

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_d5bb869b82c549d4b6525780f9d63bfa

Other Identifiers

ISSN

2045-2322

E-ISSN

2045-2322

DOI

10.1038/s41598-024-61564-8

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