Thermoelectric active cooling for transient hot spots in microprocessors
Thermoelectric active cooling for transient hot spots in microprocessors
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Publisher
London: Nature Publishing Group UK
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Language
English
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Publisher
London: Nature Publishing Group UK
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Contents
Modern microprocessor performance is limited by local hot spots induced at high frequency by busy integrated circuit elements such as the clock generator. Locally embedded thermoelectric devices (TEDs) are proposed to perform active cooling whereby thermoelectric effects enhance passive cooling by the Fourier law in removing heat from the hot spot...
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Full title
Thermoelectric active cooling for transient hot spots in microprocessors
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TN_cdi_doaj_primary_oai_doaj_org_article_e23003ec076d40b2a2c063a55464a501
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_e23003ec076d40b2a2c063a55464a501
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ISSN
2041-1723
E-ISSN
2041-1723
DOI
10.1038/s41467-024-48583-9