Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characteriz...
Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization
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Basel: MDPI AG
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English
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Basel: MDPI AG
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This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is used to solve the Maxwell equations, here the ana...
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Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization
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TN_cdi_doaj_primary_oai_doaj_org_article_eae8cd8976b84ca38111f2f036d7e0bf
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_doaj_primary_oai_doaj_org_article_eae8cd8976b84ca38111f2f036d7e0bf
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ISSN
2076-3417
E-ISSN
2076-3417
DOI
10.3390/app10238533
