Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-sh...
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
About this item
Full title
Author / Creator
Niozu, A , Kumagai, Y , Nishiyama, T , Fukuzawa, H , Motomura, K , Bucher, M , Ito, Y , Takanashi, T , Asa, K , Sato, Y , You, D , Li, Y , Ono, T , Kukk, E , Miron, C , Neagu, L , Callegari, C , Fraia, M Di , Rossi, G , Galli, D E , Pincelli, T , Colombo, A , Kameshima, T , Joti, Y , Hatsui, T , Owada, S , Katayama, T , Togashi, T , Tono, K , Yabashi, M , Matsuda, K , Bostedt, C , Nagaya, K and Ueda, K
Publisher
Bristol: IOP Publishing
Journal title
Language
English
Formats
Publication information
Publisher
Bristol: IOP Publishing
Subjects
More information
Scope and Contents
Contents
Synopsis We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and...
Alternative Titles
Full title
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Authors, Artists and Contributors
Author / Creator
Kumagai, Y
Nishiyama, T
Fukuzawa, H
Motomura, K
Bucher, M
Ito, Y
Takanashi, T
Asa, K
Sato, Y
You, D
Li, Y
Ono, T
Kukk, E
Miron, C
Neagu, L
Callegari, C
Fraia, M Di
Rossi, G
Galli, D E
Pincelli, T
Colombo, A
Kameshima, T
Joti, Y
Hatsui, T
Owada, S
Katayama, T
Togashi, T
Tono, K
Yabashi, M
Matsuda, K
Bostedt, C
Nagaya, K
Ueda, K
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_hal_primary_oai_HAL_cea_04459243v1
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_hal_primary_oai_HAL_cea_04459243v1
Other Identifiers
ISSN
1742-6588
E-ISSN
1742-6596
DOI
10.1088/1742-6596/1412/20/202028
