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X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate

X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_hal_primary_oai_HAL_hal_00283494v1

X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate

About this item

Full title

X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate

Publisher

IET

Journal title

Electronics letters, 2007-11, Vol.43 (23), p.1317-1318

Language

English

Formats

Publication information

Publisher

IET

Subjects

Subjects and topics

More information

Scope and Contents

Contents

AlInN/AlN/GaN based HEMTs were fabricated on SiC substrate to demonstrate the high potentiality of these heterostructures. The presented results confirm the high performances reachable by AlInN based technology with an output power of 6.8W/mm at 10GHz with a gate length of 0.25mum. A good extrinsic transconductance value of 400mS/mm was also measur...

Alternative Titles

Full title

X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_hal_primary_oai_HAL_hal_00283494v1

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_hal_primary_oai_HAL_hal_00283494v1

Other Identifiers

ISSN

0013-5194

E-ISSN

1350-911X

DOI

10.1049/el:20072598

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