Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
About this item
Full title
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Author / Creator
Publisher
THE ROYAL SOCIETY
Journal title
Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences, 2016-11, Vol.472 (2195), p.1-17
Language
English
Formats
Publication information
Publisher
THE ROYAL SOCIETY
Subjects
More information
Scope and Contents
Contents
We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target—the scanning field-emission microscopy regime (SFM). In the SFM mode, a secondary-electron contrast as high as 30% is observed when imaging a monoatomic step between a clean W(110)- and...
Alternative Titles
Full title
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Authors, Artists and Contributors
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Primary Identifiers
Record Identifier
TN_cdi_jstor_primary_26159987
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_jstor_primary_26159987
Other Identifiers
ISSN
1364-5021
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