Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and...
Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments
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Publisher
New York, USA: Cambridge University Press
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Language
English
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Publisher
New York, USA: Cambridge University Press
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Contents
Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the an...
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Full title
Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments
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TN_cdi_osti_scitechconnect_1327048
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_osti_scitechconnect_1327048
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ISSN
0885-7156
E-ISSN
1945-7413
DOI
10.1017/S0885715614000360
