Random variability modeling and its impact on scaled CMOS circuits
Random variability modeling and its impact on scaled CMOS circuits
About this item
Full title
Random variability modeling and its impact on scaled CMOS circuits
Author / Creator
Publisher
Heidelberg: Springer
Journal title
Journal of computational electronics, 2010-12, Vol.9 (3-4), p.108-113
Language
English
Formats
Publication information
Publisher
Heidelberg: Springer
Subjects
More information
Alternative Titles
Full title
Random variability modeling and its impact on scaled CMOS circuits
Authors, Artists and Contributors
Author / Creator
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_pascalfrancis_primary_23598953
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_pascalfrancis_primary_23598953
Other Identifiers
ISSN
1569-8025
E-ISSN
1572-8137
DOI
10.1007/s10825-010-0336-5
