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Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1,...

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1,...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1270469019

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany

About this item

Full title

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany

Publisher

New York, USA: Cambridge University Press

Journal title

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.946-947

Language

English

Formats

Publication information

Publisher

New York, USA: Cambridge University Press

More information

Scope and Contents

Contents

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Alternative Titles

Full title

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_1270469019

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1270469019

Other Identifiers

ISSN

1431-9276

E-ISSN

1435-8115

DOI

10.1017/S1431927612006587

How to access this item