Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1,...
Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany
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New York, USA: Cambridge University Press
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Language
English
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Publisher
New York, USA: Cambridge University Press
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Contents
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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Full title
Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany
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TN_cdi_proquest_journals_1270469019
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1270469019
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ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927612006587