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Patterned substrate with inverted silicon pyramids for 3C–SiC epitaxial growth: A comparison with co...

Patterned substrate with inverted silicon pyramids for 3C–SiC epitaxial growth: A comparison with co...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1289465651

Patterned substrate with inverted silicon pyramids for 3C–SiC epitaxial growth: A comparison with conventional (001) Si substrate

About this item

Full title

Patterned substrate with inverted silicon pyramids for 3C–SiC epitaxial growth: A comparison with conventional (001) Si substrate

Publisher

New York, USA: Cambridge University Press

Journal title

Journal of materials research, 2013-01, Vol.28 (1), p.94-103

Language

English

Formats

Publication information

Publisher

New York, USA: Cambridge University Press

More information

Scope and Contents

Contents

Development of 3C–SiC-based electronics is hampered by film quality and wafer bow produced during growth on silicon. This work presents an approach aimed to improve the compliance between Si and 3C–SiC by manipulating Si substrate surface with the creation of an array of squared-base Inverted Silicon Pyramids (ISP) and stimulating the annihilation...

Alternative Titles

Full title

Patterned substrate with inverted silicon pyramids for 3C–SiC epitaxial growth: A comparison with conventional (001) Si substrate

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_1289465651

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1289465651

Other Identifiers

ISSN

0884-2914

E-ISSN

2044-5326

DOI

10.1557/jmr.2012.268

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