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An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Al...

An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Al...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1922265410

An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism

About this item

Full title

An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism

Publisher

New York: Springer US

Journal title

Journal of electronic testing, 2017-08, Vol.33 (4), p.431-447

Language

English

Formats

Publication information

Publisher

New York: Springer US

More information

Scope and Contents

Contents

At present, functional verification represents the most expensive part of the digital systems design. Moreover, different problems such as: clock synchronization, code compatibility, simulation automation, new design methodologies, proper use of coverage metrics, among others represent challenges in this area. The automated test vector generation i...

Alternative Titles

Full title

An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_1922265410

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_1922265410

Other Identifiers

ISSN

0923-8174

E-ISSN

1573-0727

DOI

10.1007/s10836-017-5665-x

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