Optical quality assurance of GEM foils
Optical quality assurance of GEM foils
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Publisher
Ithaca: Cornell University Library, arXiv.org
Journal title
Language
English
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Publisher
Ithaca: Cornell University Library, arXiv.org
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Contents
An analysis software was developed for the high aspect ratio optical scanning system in the Detec- tor Laboratory of the University of Helsinki and the Helsinki Institute of Physics. The system is used e.g. in the quality assurance of the GEM-TPC detectors being developed for the beam diagnostics system of the SuperFRS at future FAIR facility. The...
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Full title
Optical quality assurance of GEM foils
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TN_cdi_proquest_journals_2075594475
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2075594475
Other Identifiers
E-ISSN
2331-8422
DOI
10.48550/arxiv.1704.06691
