Fractal analysis of BaF2 thin films deposited on different substrates
Fractal analysis of BaF2 thin films deposited on different substrates
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Author / Creator
Kavyashree , Pandey, R K , Yadav, R P , Kumar, Manvendra , Mittal, A K , Pandey, A C and Pandey, S N
Publisher
Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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Barrium fluoride (BaF2) thin films were prepared by electron beam evaporation technique at room temperature, on glass, Silicon and Aluminum substrates having thickness of 20 nm each. Its structural property and surface morphology were studied using glancing angle X-ray diffraction (GAXRD) and atomic force microscopy (AFM) respectively. It was found...
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Full title
Fractal analysis of BaF2 thin films deposited on different substrates
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TN_cdi_proquest_journals_2075900716
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2075900716
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E-ISSN
2331-8422
