Machine learning applied to single-shot x-ray diagnostics in an XFEL
Machine learning applied to single-shot x-ray diagnostics in an XFEL
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Author / Creator
Sanchez-Gonzalez, A , Micaelli, P , Olivier, C , Barillot, T R , Ilchen, M , Lutman, A A , Marinelli, A , Maxwell, T , Achner, A , Agåker, M , Berrah, N , Bostedt, C , Buck, J , Bucksbaum, P H , S Carron Montero , Cooper, B , Cryan, J P , Dong, M , Feifel, R , Frasinski, L J , Fukuzawa, H , Galler, A , Hartmann, G , Hartmann, N , Helml, W , Johnson, A S , Knie, A , Lindahl, A O , Liu, J , Motomura, K , Mucke, M , O'Grady, C , J-E Rubensson , Simpson, E R , Squibb, R J , Såthe, C , Ueda, K , Vacher, M , Walke, D J , Zhaunerchyk, V , Coffee, R N and Marangos, J P
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Ithaca: Cornell University Library, arXiv.org
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Ithaca: Cornell University Library, arXiv.org
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Contents
X-ray free-electron lasers (XFELs) are the only sources currently able to produce bright few-fs pulses with tunable photon energies from 100 eV to more than 10 keV. Due to the stochastic SASE operating principles and other technical issues the output pulses are subject to large fluctuations, making it necessary to characterize the x-ray pulses on e...
Alternative Titles
Full title
Machine learning applied to single-shot x-ray diagnostics in an XFEL
Authors, Artists and Contributors
Author / Creator
Micaelli, P
Olivier, C
Barillot, T R
Ilchen, M
Lutman, A A
Marinelli, A
Maxwell, T
Achner, A
Agåker, M
Berrah, N
Bostedt, C
Buck, J
Bucksbaum, P H
S Carron Montero
Cooper, B
Cryan, J P
Dong, M
Feifel, R
Frasinski, L J
Fukuzawa, H
Galler, A
Hartmann, G
Hartmann, N
Helml, W
Johnson, A S
Knie, A
Lindahl, A O
Liu, J
Motomura, K
Mucke, M
O'Grady, C
J-E Rubensson
Simpson, E R
Squibb, R J
Såthe, C
Ueda, K
Vacher, M
Walke, D J
Zhaunerchyk, V
Coffee, R N
Marangos, J P
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Primary Identifiers
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TN_cdi_proquest_journals_2076087489
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2076087489
Other Identifiers
E-ISSN
2331-8422
DOI
10.48550/arxiv.1610.03378
