Probing 5f-state configurations in URu2Si2 with U L3-edge resonant x-ray emission spectroscopy
Probing 5f-state configurations in URu2Si2 with U L3-edge resonant x-ray emission spectroscopy
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Author / Creator
Booth, C H , Medling, S A , Tobin, J G , Baumbach, R E , Bauer, E D , Sokaras, D , Nordlund, D and T -C Weng
Publisher
Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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Contents
Resonant x-ray emission spectroscopy (RXES) was employed at the U L3 absorption edge and the La1 emission line to explore the 5f occupancy, nf, and the degree of 5f orbital delocalization in the hidden order compound URu2Si2. By comparing to suitable reference materials such as UF4, UCd11, and alpha-U, we conclude that the 5f orbital in URu2Si2 is...
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Full title
Probing 5f-state configurations in URu2Si2 with U L3-edge resonant x-ray emission spectroscopy
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TN_cdi_proquest_journals_2080029261
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2080029261
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E-ISSN
2331-8422
DOI
10.48550/arxiv.1607.03953
