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Scaling of 1/f noise in tunable break-junctions

Scaling of 1/f noise in tunable break-junctions

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2083740245

Scaling of 1/f noise in tunable break-junctions

About this item

Full title

Scaling of 1/f noise in tunable break-junctions

Publisher

Ithaca: Cornell University Library, arXiv.org

Journal title

arXiv.org, 2008-09

Language

English

Formats

Publication information

Publisher

Ithaca: Cornell University Library, arXiv.org

More information

Scope and Contents

Contents

We have studied the \(1/f\) voltage noise of gold nano-contacts in electromigrated and mechanically controlled break-junctions having resistance values \(R\) that can be tuned from 10 \(\Omega\) (many channels) to 10 k\(\Omega\) (single atom contact). The noise is caused by resistance fluctuations as evidenced by the \(S_V\propto V^2\) dependence o...

Alternative Titles

Full title

Scaling of 1/f noise in tunable break-junctions

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2083740245

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2083740245

Other Identifiers

E-ISSN

2331-8422

DOI

10.48550/arxiv.0809.4841

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