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Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural...

Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2089924254

Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural Strain

About this item

Full title

Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural Strain

Publisher

Ithaca: Cornell University Library, arXiv.org

Journal title

arXiv.org, 2008-11

Language

English

Formats

Publication information

Publisher

Ithaca: Cornell University Library, arXiv.org

More information

Scope and Contents

Contents

The evolution in the surface morphology of epitaxial graphene films and 6H-SiC(0001) substrates is studied by electron channeling contrast imaging. Whereas film thickness is determined by growth temperature only, increasing growth times at constant temperature affect both internal stress and film morphology. Annealing times in excess of 8-10 minute...

Alternative Titles

Full title

Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural Strain

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2089924254

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2089924254

Other Identifiers

E-ISSN

2331-8422

DOI

10.48550/arxiv.0810.5171

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