Correlation of Beam Electron and LED Signal Losses under Irradiation and Long-term Recovery of Lead...
Correlation of Beam Electron and LED Signal Losses under Irradiation and Long-term Recovery of Lead Tungstate Crystals
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Author / Creator
Batarin, V A , Butler, J , Davidenko, A M , Derevschikov, A A , Goncharenko, Y M , Grishin, V N , Kachanov, V A , Konstantinov, A S , Kravtsov, V I , Kubota, Y , Lukanin, V S , Matulenko, Y A , Melnick, Y M , Meschanin, A P , Mikhalin, N E , Minaev, N G , Mochalov, V V , Morozov, D A , Nogach, L V , Ryazantsev, A V , Semenov, P A , Semenov, V K , Shestermanov, K E , Soloviev, L F , Stone, S , Uzunian, A V , Vasiliev, A N , Yakutin, A E and Yarba, J
Publisher
Ithaca: Cornell University Library, arXiv.org
Journal title
Language
English
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Publication information
Publisher
Ithaca: Cornell University Library, arXiv.org
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More information
Scope and Contents
Contents
Radiation damage in lead tungstate crystals reduces their transparency. The calibration that relates the amount of light detected in such crystals to incident energy of photons or electrons is of paramount importance to maintaining the energy resolution the detection system. We report on tests of lead tungstate crystals, read out by photomultiplier...
Alternative Titles
Full title
Correlation of Beam Electron and LED Signal Losses under Irradiation and Long-term Recovery of Lead Tungstate Crystals
Authors, Artists and Contributors
Author / Creator
Butler, J
Davidenko, A M
Derevschikov, A A
Goncharenko, Y M
Grishin, V N
Kachanov, V A
Konstantinov, A S
Kravtsov, V I
Kubota, Y
Lukanin, V S
Matulenko, Y A
Melnick, Y M
Meschanin, A P
Mikhalin, N E
Minaev, N G
Mochalov, V V
Morozov, D A
Nogach, L V
Ryazantsev, A V
Semenov, P A
Semenov, V K
Shestermanov, K E
Soloviev, L F
Stone, S
Uzunian, A V
Vasiliev, A N
Yakutin, A E
Yarba, J
Identifiers
Primary Identifiers
Record Identifier
TN_cdi_proquest_journals_2090734974
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2090734974
Other Identifiers
E-ISSN
2331-8422
DOI
10.48550/arxiv.0504085
