Structural origins of electronic conduction in amorphous copper-doped alumina
Structural origins of electronic conduction in amorphous copper-doped alumina
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Author / Creator
Subedi, K N , Prasai, K , Kozicki, M N and Drabold, D A
Publisher
Ithaca: Cornell University Library, arXiv.org
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Language
English
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Publisher
Ithaca: Cornell University Library, arXiv.org
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Contents
We perform an {\it ab initio} modeling of amorphous copper-doped alumina (a-Al\(_2\)O\(_3\):Cu), a prospective memory material based on resistance switching, and study the structural origin of electronic conduction in this material. We generate molecular dynamics based models of a-Al\(_2\)O\(_3\):Cu at various Cu-concentrations and study the struct...
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Full title
Structural origins of electronic conduction in amorphous copper-doped alumina
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TN_cdi_proquest_journals_2186324318
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2186324318
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E-ISSN
2331-8422
DOI
10.48550/arxiv.1902.07559
