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Recent Advances in the Doping of 4H-SiC by Channeled Ion Implantation

Recent Advances in the Doping of 4H-SiC by Channeled Ion Implantation

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2260266945

Recent Advances in the Doping of 4H-SiC by Channeled Ion Implantation

About this item

Full title

Recent Advances in the Doping of 4H-SiC by Channeled Ion Implantation

Publisher

Pfaffikon: Trans Tech Publications Ltd

Journal title

Materials science forum, 2019-07, Vol.963, p.375-381

Language

English

Formats

Publication information

Publisher

Pfaffikon: Trans Tech Publications Ltd

More information

Scope and Contents

Contents

The effect of lattice thermal vibrations on the channeling of 100 keV Al ions in 4H-SiC is investigated. By implanting at room temperature in the direction, the depth distribution of the incident ions is shown to be about 7 times deeper than for random implantations. At higher implantation temperatures, the channeling is reduced by the lattice vibr...

Alternative Titles

Full title

Recent Advances in the Doping of 4H-SiC by Channeled Ion Implantation

Authors, Artists and Contributors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2260266945

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2260266945

Other Identifiers

ISSN

0255-5476,1662-9752

E-ISSN

1662-9752

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