Correlation of Multiplicity and Chemistry in AlxGa1−xN Heterostructure via Atom Probe Tomography
Correlation of Multiplicity and Chemistry in AlxGa1−xN Heterostructure via Atom Probe Tomography
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Oxford: Oxford University Press
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English
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Oxford: Oxford University Press
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In this work, the correlation between composition and relative evaporation field was investigated by tracking the statistics of multi-hit detector events in atom probe tomography (APT). This approach is applied systematically to a GaN-based nitride heterostructure with five AlxGa1−xN layers of varying Al composition. The relative field evaporation...
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Correlation of Multiplicity and Chemistry in AlxGa1−xN Heterostructure via Atom Probe Tomography
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TN_cdi_proquest_journals_2366296662
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2366296662
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ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927619015277
