Dislocation-controlled microscopic mechanical phenomena in single crystal silicon under bending stre...
Dislocation-controlled microscopic mechanical phenomena in single crystal silicon under bending stress at room temperature
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Publisher
New York: Springer US
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Language
English
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Publisher
New York: Springer US
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Contents
Silicon is widely used within energy, electro-mechanical, environmental devices by nanostructural control. As silicon parts constitute structural components whose size is ever decreasing, it is critical to understand the mechanical properties of single crystal silicon from precise measurements of load and displacement using microscopic sample in su...
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Full title
Dislocation-controlled microscopic mechanical phenomena in single crystal silicon under bending stress at room temperature
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TN_cdi_proquest_journals_2379986862
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2379986862
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ISSN
0022-2461
E-ISSN
1573-4803
DOI
10.1007/s10853-020-04528-3
