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Accurate Determination of Semiconductor Diffusion Coefficient Using Optical Microscopy

Accurate Determination of Semiconductor Diffusion Coefficient Using Optical Microscopy

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2383709702

Accurate Determination of Semiconductor Diffusion Coefficient Using Optical Microscopy

About this item

Full title

Accurate Determination of Semiconductor Diffusion Coefficient Using Optical Microscopy

Publisher

Ithaca: Cornell University Library, arXiv.org

Journal title

arXiv.org, 2021-01

Language

English

Formats

Publication information

Publisher

Ithaca: Cornell University Library, arXiv.org

More information

Scope and Contents

Contents

Energy carrier transport and recombination in emerging semiconductors can be directly monitored with optical microscopy, leading to the measurement of the diffusion coefficient (D), a critical property for design of efficient optoelectronic devices. D is often determined by fitting a time-resolved expanding carrier profile after optical excitation...

Alternative Titles

Full title

Accurate Determination of Semiconductor Diffusion Coefficient Using Optical Microscopy

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2383709702

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2383709702

Other Identifiers

E-ISSN

2331-8422

DOI

10.48550/arxiv.2003.11665

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