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Analytical Model for Two-Dimensional Electron Gas Charge Density in Recessed-Gate GaN High-Electron-...

Analytical Model for Two-Dimensional Electron Gas Charge Density in Recessed-Gate GaN High-Electron-...

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2532438751

Analytical Model for Two-Dimensional Electron Gas Charge Density in Recessed-Gate GaN High-Electron-Mobility Transistors

About this item

Full title

Analytical Model for Two-Dimensional Electron Gas Charge Density in Recessed-Gate GaN High-Electron-Mobility Transistors

Publisher

New York: Springer US

Journal title

Journal of electronic materials, 2021-07, Vol.50 (7), p.3923-3929

Language

English

Formats

Publication information

Publisher

New York: Springer US

More information

Scope and Contents

Contents

A physics-based analytical model for GaN high-electron-mobility transistors (HEMTs) with non-recessed- and recessed-gate structure is presented. Based on this model, the two-dimensional electron gas density (2DEG) and thereby the on-state resistance and breakdown voltage can be controlled by varying the barrier layer thickness and Al mole fraction...

Alternative Titles

Full title

Analytical Model for Two-Dimensional Electron Gas Charge Density in Recessed-Gate GaN High-Electron-Mobility Transistors

Identifiers

Primary Identifiers

Record Identifier

TN_cdi_proquest_journals_2532438751

Permalink

https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2532438751

Other Identifiers

ISSN

0361-5235

E-ISSN

1543-186X

DOI

10.1007/s11664-021-08842-7

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