Aberration measurement and correction on a large field of view in fluorescence microscopy
Aberration measurement and correction on a large field of view in fluorescence microscopy
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Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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The aberrations induced by the sample and/or by the sample holder limit the resolution of optical microscopes. Wavefront correction can be achieved using a deformable mirror with wavefront sensorless optimization algorithms but, despite the complexity of these systems, the level of correction is often limited to a small area in the field of view of...
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Aberration measurement and correction on a large field of view in fluorescence microscopy
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TN_cdi_proquest_journals_2537019383
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2537019383
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2331-8422
