Benchmarking ideal sample thickness in cryo-EM using MicroED
Benchmarking ideal sample thickness in cryo-EM using MicroED
About this item
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Author / Creator
Publisher
Cold Spring Harbor: Cold Spring Harbor Laboratory Press
Journal title
Language
English
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Publication information
Publisher
Cold Spring Harbor: Cold Spring Harbor Laboratory Press
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Scope and Contents
Contents
The relationship between sample thickness and quality of data obtained by microcrystal electron diffraction (MicroED) is investigated. Several EM grids containing proteinase K microcrystals of similar sizes from the same crystallization batch were prepared. Each grid was transferred into a focused ion-beam scanning electron microscope (FIB/SEM) whe...
Alternative Titles
Full title
Benchmarking ideal sample thickness in cryo-EM using MicroED
Authors, Artists and Contributors
Author / Creator
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Record Identifier
TN_cdi_proquest_journals_2548028682
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2548028682
Other Identifiers
ISSN
2692-8205
E-ISSN
2692-8205
DOI
10.1101/2021.07.02.450941
