Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional S...
Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector
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Oxford: Oxford University Press
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English
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Oxford: Oxford University Press
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The recent development of electron-sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present a precession electron diffraction-assisted 4D-STEM technique for automated orientation mapping using diffraction spot patterns directly captured by an in-column scintill...
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Full title
Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector
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TN_cdi_proquest_journals_2574265600
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https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2574265600
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ISSN
1431-9276
E-ISSN
1435-8115
DOI
10.1017/S1431927621012538
