Oscillation photography applied to resonant x-ray diffraction
Oscillation photography applied to resonant x-ray diffraction
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Author / Creator
Inami, T , Toyokawa, H , Terada, N and Kitazawa, H
Publisher
Bristol: IOP Publishing
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Bristol: IOP Publishing
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Recently, resonant x-ray diffraction has been used for detecting charge, magnetic and multipole orders. In practice, however, this technique surveys only a small portion of the reciprocal space. In this study, we applied oscillation photography to resonant x-ray diffraction. For a test sample, we explored nearly a whole Brillouin zone and successfu...
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Full title
Oscillation photography applied to resonant x-ray diffraction
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TN_cdi_proquest_journals_2580233507
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2580233507
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ISSN
1742-6596,1742-6588
E-ISSN
1742-6596
DOI
10.1088/1742-6596/150/4/042069