Significant reduction in semiconductor interface resistance via interfacial atomic mixing
Significant reduction in semiconductor interface resistance via interfacial atomic mixing
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Ithaca: Cornell University Library, arXiv.org
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English
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Ithaca: Cornell University Library, arXiv.org
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Contents
The contact resistance between two dissimilar semiconductors is determined by the carrier transmission through their interface. Despite the ubiquitous presence of interfaces, quantitative simulation of charge transport across such interfaces is difficult, limiting the understanding of interfacial charge transport. This work employs Green's function...
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Full title
Significant reduction in semiconductor interface resistance via interfacial atomic mixing
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TN_cdi_proquest_journals_2615378489
Permalink
https://devfeature-collection.sl.nsw.gov.au/record/TN_cdi_proquest_journals_2615378489
Other Identifiers
E-ISSN
2331-8422
DOI
10.48550/arxiv.2112.14400
